SPview II main screen
SPview is an S-Parameter toolset for RF and Microwave engineering.With built in GPIB, LAN, USB and RS232 capabilities, it can capture data directly from Vector Network Analyzers, Spectrum Analyzers, Scalar Analyzers and Oscilloscopes. It can produce S-parameter files compatible with all major simulators. Built in charting and data manipulation features enable faster circuit design, the2-port functions charts are particularly useful for amplifier designers often removing several measure/simulate cycles.
SPview gives older VNA's the facilities available in newer and more expensive models and additionally it can capture N-port data, that is, 3,4..99 port data can be captured using only a 2-port or T/R Analyser and saved as S-parameter files.
Spview supports National Instruments NI488, Agilent SICL libraries along with VISA from many vendors. RS USB smart instruments are also supported.
No third party drivers/libraries are require to capture data from instruments equipped with a LAN port.
SPview can also import and Contour map Load-pull data from both Focus and Maury file formats.
SPview 3 now includes a full multiport linear simulator complete with visual schematic editor. Data files can be drag and dropped onto schematics and connected to other components such as resistors, capacitors, inductors and transmission lines. Ports can be changed to any arbitrary real impedance and the schematic editor also includes a NEG2 element to allow S-parameter data to be de-embedded on a port by port basis.
The schematics are accompanied by a comprehensive suite of measurements, all simulation is fully automatic, no need to set up special simulation settings.
SPview now comes with a suite of mathemetical features, plot any equation as a function of a swept variable, equations can operate on complex as well as scalar data. Equations produce new traces as a function of variables and/or existing trace data.
The new poynomial trend line feature creates and plots equations from existing trace data.
Statistical analysis functions combine with special tools to search for and combine data in disk folders. Now historical data from production runs can be combined and min/max, mean and standard deviation can be applied.
SPview is fully programmable via the ActiveX scripting system, Visual Basic and Jscript are fully integrated. Users can also program the remote control interface through the comprehensive programming API.
For a list of Instruments directly supported by SPview, see Supported Equipment.
Any instrument can be controlled via the script system.
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